The X-ray analysis platform aims to characterize materials originating from LGF research.
Two techniques are represented.
X-ray absorption tomography is a non-destructive imaging technique that involves reconstructing the volume of an object in three dimensions. Defects (pores, cracks) and heterogeneities present in the analyzed object are then visualized.
X-ray diffraction on powders or bulk samples provides information on the crystalline state of the material. The interpretation of measurements, using software (DIFFRAC EVA, TOPAS, HighScore, etc.) and databases (ICDD PDF-4+, COD), allows for the determination of the phases present, their textures, and residual stresses.
Available Equipment
- Tomography
- GE Nanotom 180 Tomograph
- Available diffractometers:
- Bruker D8A25 with sample changer,
- Bruker D8Advance with high-temperature chamber,
- PANalytical XPertPro MPD and MRD with Euler cradle (Cu and Co source optics),
- MRX XRaybot.
Bruker D8A25 avec passeur d’échantillons
MRX XRaybot – contraintes résiduelles